• Tackling the Challenging Determination of Trace Elements in Ultrapure Silicon Carbide by LA-ICP-MS 

      Spanu, Davide; Palestra, Alessandro; Prina, Veronica; Monticelli, Damiano; Bonanomi, Simone; Nanot, Sandro Usseglio; Binda, Gilberto; Rampazzi, Laura; Sessa, Gianluca; Callejo Munoz, David; Recchia, Sandro (Peer reviewed; Journal article, 2023)
      The goal of accurately quantifying trace elements in ultrapure silicon carbide (SiC) with a purity target of 5N (99.999% purity) was addressed. The unsuitability of microwave-assisted acid digestion followed by Inductively ...